The Pilot V8 Next> series represents an important technological innovation in double-sided flying probe test, overcoming the intrinsic limitations of horizontal systems.
Its vertical architecture is the optimum solution for probing both sides of the UUT simultaneously. This increases test throughput and flexibility while guaranteeing fast, precise, reliable and repeatable probing and full availability of all the mobile resources for testing the UUT.

TEST PERFORMANCES:
– In-Circuit test
– Functional test
– Power on functional test
– OTPN (One Touch Per Net) with Fnode to detect shorts open & Nodal Impedance
– OPENFIX
– On-Board Programming
– Boundary Scan
– Thermal Test
– LED Test
– FLYSTRAIN (Real time)
– LASER warpage compensationn

Ask for the Technical Data Sheet: sales@seica.com.